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Volumn 33, Issue 2 I, 2005, Pages 254-255
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Plasma emission imaging of electrical breakdown in low-pressure argon
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Author keywords
Charge coupled device; Electrical breakdown; Gas discharges; Optical imaging
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Indexed keywords
ARGON;
CHARGE COUPLED DEVICES;
IMAGING TECHNIQUES;
LIGHT EMISSION;
PLASMA APPLICATIONS;
GAS DISCHARGES;
PLASMA BREAKDOWN;
PLASMA EMISSION IMAGING;
ELECTRIC BREAKDOWN;
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EID: 18844401390
PISSN: 00933813
EISSN: None
Source Type: Journal
DOI: 10.1109/TPS.2005.844944 Document Type: Article |
Times cited : (6)
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References (3)
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