On-wafer I/V measurement setup for the characterization of low-frequency dispersion in electron devices

63rd ARFTG Conference Digest, Spring 2004, Automatic RF Techniques Group: On Wafer Characterization

Volumn , Issue , 2004, Pages 21-28

  Raffo, A ^a   Santarelli, A ^b   Traverso, P A ^b   Vannini, G ^a   Filicori, F ^b  

^a UNIVERSITY OF FERRARA   (Italy)

^b UNIVERSITY OF BOLOGNA   (Italy)

Author keywords

Dispersive phenomena; Field effect transistors; Large signal modeling; Semiconductor device characterisation

Indexed keywords

BANDWIDTH; CURRENT VOLTAGE CHARACTERISTICS; ENERGY DISSIPATION; EQUIVALENT CIRCUITS; FIELD EFFECT TRANSISTORS; MATHEMATICAL MODELS; SEMICONDUCTOR JUNCTIONS; THERMAL EFFECTS;

DEVICE-UNDER-TEST (DUT); DISPESIVE PHENOMENA; LARGE-SCALE MODELING; SEMICONDUCTOR DEVICE CHARACTERIZATION;

ELECTRONIC EQUIPMENT;

EID: 18844393950     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (10)

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