Network analyzer measurement De-embedding utilizing a distributed transmission matrix bisection of a single THRU structure

63rd ARFTG Conference Digest, Spring 2004, Automatic RF Techniques Group: On Wafer Characterization

Volumn , Issue , 2004, Pages 61-68

  Daniel, Erik S ^a   Harff, Nathan E ^a   Sokolov, Vladimir ^a   Schreiber, Shaun M ^a   Gilbert, Barry K ^a  

^a MAYO CLINIC   (United States)

Author keywords

De embedding; On wafer measurement; S parameters; Transmission line; Transmission matrix; Vector network analyzer

Indexed keywords

CALIBRATION; ELECTRIC LINES; INTEGRATED CIRCUITS; MATRIX ALGEBRA; SCATTERING PARAMETERS; VECTORS; WSI CIRCUITS;

DE-EMBEDDING; ON-WAFER MEASUREMENT; TRANSMISSION MATRIX; VECTOR NETWORK ANALYZER;

EMBEDDED SYSTEMS;

EID: 18844385434     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (8)

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