The kinetics of internal structural relaxation of metallic glasses probed with ion beams and resistivity measurements

Journal of Applied Physics

Volumn 97, Issue 9, 2005, Pages

  Mayr, S G ^a  

^a UNIVERSITY OF GÖTTINGEN   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

ROOT MEAN SQUARE (RMS); SCANNING PROBE MICROSCOPY; STRUCTURAL RELAXATION; VACUUM CHAMBERS;

ANNEALING; ELECTRIC CONDUCTIVITY; ION BEAMS; ION BOMBARDMENT; MICROSCOPIC EXAMINATION; REACTION KINETICS; RELAXATION PROCESSES; STRUCTURE (COMPOSITION); SURFACE ROUGHNESS; SURFACE TOPOGRAPHY; ULTRAHIGH VACUUM;

METALLIC GLASS;

EID: 18844384683     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1884753     Document Type: Article

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