X-ray optics 'Owl' and 'Trinity'

Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers

Volumn 41, Issue 7 A, 2002, Pages 4742-4749

  Ando, Masami ^a,h   Hyodo, Kazuyuki ^b   Sugiyama, Hiroshi ^c   Maksimenko, Anton ^d   Pattanasiriwisawa, Wanwisa ^e   Mori, Koichi ^f   Roberson, Joseph ^b,c,d   Rubenstein, Edward ^d,e   Tanaka, Yoshihisa ^g   Chen, Junyuan ^g,h   Xian, Dingchang ^g   Xiaowei, Zhang ^a  

^a INSTITUTE OF MATERIALS STRUCTURE SCIENCE   (Japan)

^b GRADUATE UNIVERSITY FOR ADVANCED STUDIES   (Japan)

^c IBARAKI PREFECTURAL UNIVERSITY OF HEALTH SCIENCES   (Japan)

^d California Ear Institute   (United States)

^e STANFORD UNIVERSITY SCHOOL OF MEDICINE   (United States)

^f NATIONAL INSTITUTE FOR MATERIALS SCIENCE   (Japan)

^g Nanjing Inst of Geol and P   (China)

^h INSTITUTE OF HIGH ENERGY PHYSICS   (China)

Author keywords

Analyzer; Asymmetric reflection monochromator; Crystal diffraction index; Crystal thickness; Fz grown silicon; Refraction contrast; Synchrotron x radiation; Vertical wiggler; X ray bright field imaging; X ray dark field imaging

Indexed keywords

IMAGE ANALYSIS; LIGHT ABSORPTION; LIGHT REFRACTION; MONOCHROMATORS; OPTICAL COLLIMATORS;

CRYSTAL DIFFRACTION INDEX; VERTICAL WIGGLER; X RAY BRIGHT FIELD IMAGING; X RAY DARK FIELD IMAGING;

X RAY OPTICS;

EID: 18744419521     PISSN: 00214922     EISSN: None     Source Type: Journal    
DOI: 10.1143/jjap.41.4742     Document Type: Article

References (54)