High frequency-bandwidth optical technique to measure thermal elongation time responses of near-field scanning optical microscopy probes

Review of Scientific Instruments

Volumn 73, Issue 11, 2002, Pages 3837-

  Biehler, B ^a   La Rosa, A H ^a  

^a PORTLAND STATE UNIVERSITY   (United States)

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Indexed keywords

EID: 18744415057     PISSN: 00346748     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1510548     Document Type: Article

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