메뉴 건너뛰기




Volumn 15, Issue 6, 2005, Pages 1131-1139

The viability of anisotropic conductive film as a flip chip interconnect technology for MEMS devices

Author keywords

Anisotropic conductive film; Contact resistance; Flip chip; MEMS; Packaging; Parylene; Pressure sensor

Indexed keywords

ANISOTROPY; BONDING; CAPACITANCE; CONDUCTIVE FILMS; DIES; ELECTRIC POTENTIAL; ELECTRIC RESISTANCE; ELECTRONICS PACKAGING; FLIP CHIP DEVICES; SENSORS;

EID: 18744414493     PISSN: 09601317     EISSN: None     Source Type: Journal    
DOI: 10.1088/0960-1317/15/6/003     Document Type: Article
Times cited : (27)

References (18)
  • 6
    • 0034478425 scopus 로고    scopus 로고
    • The viability of anisotropic conductive film (ACF) as a flip chip interconnection technology
    • Kim K M et al 2000 The viability of anisotropic conductive film (ACF) as a flip chip interconnection technology Electronic Components and Technology Conf.
    • (2000) Electronic Components and Technology Conf.
    • Kim, K.M.1    Al, E.2
  • 7
    • 0037301959 scopus 로고    scopus 로고
    • Effect of autoclave test on anisotropic conductive joints
    • 10.1016/S0026-2714(02)00293-7 0026-2714
    • Tan C W, Chan Y C and Yeung N H 2003 Effect of autoclave test on anisotropic conductive joints Microelectron. Reliab. 43 279-85
    • (2003) Microelectron. Reliab. , vol.43 , Issue.2 , pp. 279-285
    • Tan, C.W.1    Chan, Y.C.2    Yeung, N.H.3
  • 8
    • 1642437908 scopus 로고    scopus 로고
    • Fundamental understanding of ACF conduction establishment with emphasis on the thermal and mechanical analysis
    • 0143-7496
    • Won W-S K and Paik K-W 2004 Fundamental understanding of ACF conduction establishment with emphasis on the thermal and mechanical analysis Int. J. Adhes. Adhes. 24 135-42
    • (2004) Int. J. Adhes. Adhes. , vol.24 , pp. 135-142
    • Won, W.-S.K.1    Paik, K.-W.2
  • 9
    • 0002725101 scopus 로고    scopus 로고
    • Recent advances in conductive adhesives for direct chip attach applications
    • Liu J 1998 Recent advances in conductive adhesives for direct chip attach applications Microsystems Technologies vol 5 (Berlin: Springer) pp 72-80
    • (1998) Microsystems Technologies , vol.5 , pp. 72-80
    • Liu, J.1
  • 10
    • 0030380733 scopus 로고    scopus 로고
    • Analytical techniques for examining reliability and failure mechanisms of barrier coating encapsulated silicon pressure sensors exposed to harsh media
    • 10.1117/12.250710 0277-786X
    • Bitko G, Monk D, Maudie T, Stanerson D, Wertz J, Matkin J and Petrovic S 1996 Analytical techniques for examining reliability and failure mechanisms of barrier coating encapsulated silicon pressure sensors exposed to harsh media Proc. SPIE 2882 248-58
    • (1996) Proc. SPIE , vol.2882 , pp. 248-258
    • Bitko, G.1    Monk, D.2    Maudie, T.3    Stanerson, D.4    Wertz, J.5    Matkin, J.6    Petrovic, S.7
  • 11
    • 0009745791 scopus 로고    scopus 로고
    • DSP based CMOS monolithic pressure sensor for high volume manufacturing
    • Ding X, Czarnocki W, Schuster J P and Roeckner B 1999 DSP based CMOS monolithic pressure sensor for high volume manufacturing Transducers '99 pp 362-5
    • (1999) Transducers '99 , pp. 362-365
    • Ding, X.1    Czarnocki, W.2    Schuster, J.P.3    Roeckner, B.4
  • 13
    • 0033749885 scopus 로고    scopus 로고
    • Packaging a piezoresistive pressure sensor to measure low absolute pressures over a wide sub-zero temperature range
    • 10.1016/S0924-4247(00)00294-6 0924-4247
    • Reynolds J K, Catling D, Blue R C, Maluf N I and Kenny T 2000 Packaging a piezoresistive pressure sensor to measure low absolute pressures over a wide sub-zero temperature range Sensors Actuators 83 142-59
    • (2000) Sensors Actuators , vol.83 , Issue.1-3 , pp. 142-159
    • Reynolds, J.K.1    Catling, D.2    Blue, R.C.3    Maluf, N.I.4    Kenny, T.5
  • 14
  • 16
    • 18744403253 scopus 로고    scopus 로고
    • Crain M M 1999 Development of a microfabricated piezoresistive pressure transducer for an introductory course in microfabrication MS Thesis
    • (1999) MS Thesis
    • Crain, M.M.1
  • 18
    • 0037381421 scopus 로고    scopus 로고
    • The effect of reflow process on the contact resistance and reliability of anisotropic conductive film interconnection for flip chip on flex applications
    • 10.1016/S0026-2714(02)00348-7 0026-2714
    • Yin C Y, Alam M O, Chan Y C, Bailey C and Hua Lu 2003 The effect of reflow process on the contact resistance and reliability of anisotropic conductive film interconnection for flip chip on flex applications Microelectron. Reliab. 43 625-33
    • (2003) Microelectron. Reliab. , vol.43 , Issue.4 , pp. 625-633
    • Yin, C.Y.1    Alam, M.O.2    Chan, Y.C.3    Bailey, C.4    Lu, H.5


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.