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Volumn 31, Issue 2, 2005, Pages 173-176

Photoinduced transformations in Ga-Ge-S : EEr films prepared by laser deposition

Author keywords

[No Author keywords available]

Indexed keywords

CHEMICAL BONDS; DEPOSITION; INFRARED SPECTROSCOPY; LASER BEAMS; OXIDATION; PHOTOCHEMICAL REACTIONS; REFRACTIVE INDEX; SCANNING ELECTRON MICROSCOPY;

EID: 18744413265     PISSN: 10876596     EISSN: None     Source Type: Journal    
DOI: 10.1007/s10720-005-0041-9     Document Type: Article
Times cited : (7)

References (6)
  • 1
    • 0041753446 scopus 로고    scopus 로고
    • Pulsed laser deposition of pure and praseodymium-doped Ge-Ga-Se amorphous chalcogenide films
    • Nemec, P., Frumar, M., Frumarova, B., Jelinek, M., Lancok, J., and Jedelsky, J., Pulsed Laser Deposition of Pure and Praseodymium-Doped Ge-Ga-Se Amorphous Chalcogenide Films, Opt. Mater., 2000, vol. 15, pp. 191-197.
    • (2000) Opt. Mater. , vol.15 , pp. 191-197
    • Nemec, P.1    Frumar, M.2    Frumarova, B.3    Jelinek, M.4    Lancok, J.5    Jedelsky, J.6
  • 3
    • 0242302570 scopus 로고    scopus 로고
    • Optical properties and applications of chalcogenide glasses: A review
    • Zakery, A. and Elliott, S.R., Optical Properties and Applications of Chalcogenide Glasses: A Review, J. Non-Cryst. Solids, 2003, vol. 330, pp. 1-12.
    • (2003) J. Non-cryst. Solids , vol.330 , pp. 1-12
    • Zakery, A.1    Elliott, S.R.2
  • 5
    • 18744365414 scopus 로고
    • An optical method for measuring the thickness of transparent and translucent films
    • Kashirskii, I.M., Bulyshev, Yu.S., and Sinitskii, V.V., An Optical Method for Measuring the Thickness of Transparent and Translucent Films, Prib. Tekh. Eksp., 1982, no. 2, p. 195.
    • (1982) Prib. Tekh. Eksp. , Issue.2 , pp. 195
    • Kashirskii, I.M.1    Bulyshev, Yu.S.2    Sinitskii, V.V.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.