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Volumn 73, Issue 10, 2002, Pages 3584-
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Characterization of silicon micro-oscillators by scanning laser vibrometry
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SFA INC
(United States)
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Author keywords
[No Author keywords available]
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Indexed keywords
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EID: 18744413230
PISSN: 00346748
EISSN: None
Source Type: Journal
DOI: 10.1063/1.1502014 Document Type: Article |
Times cited : (31)
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References (0)
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