|
Volumn 242, Issue 6, 2005, Pages 1229-1232
|
Shot noise as a probe of electron transport via localised states in sub-micrometer barriers
|
Author keywords
[No Author keywords available]
|
Indexed keywords
|
EID: 18744395194
PISSN: 03701972
EISSN: None
Source Type: Journal
DOI: 10.1002/pssb.200460770 Document Type: Article |
Times cited : (3)
|
References (12)
|