Refractory clad transient internal probe for magnetic field measurements in high temperature plasmas

Review of Scientific Instruments

Volumn 76, Issue 5, 2005, Pages

  Kim, Hyundae ^a   Cellamare, Vincent ^a   Jarboe, Thomas R ^a   Mattick, Arthur T ^a  

^a UNIVERSITY OF WASHINGTON   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ELLIPSOMETERS; HIGH TEMPERATURE PLASMAS; REFRACTORY CLAD TRANSIENT INTERNAL PROBES; RETEROREFLECTORS;

ACCELERATION; CLADDING (COATING); ELLIPSOMETRY; LASER APPLICATIONS; LIGHT POLARIZATION; MAGNETIC FIELD MEASUREMENT; MELTING; PLASMA APPLICATIONS; REFLECTION; REFRACTORY MATERIALS;

PROBES;

EID: 18744390334     PISSN: 00346748     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1898963     Document Type: Article

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