Highly sensitive method for measuring the onset of damage using a micro channel plate

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 5647, Issue , 2005, Pages 379-384

  Schwarz, Jens ^a   Ruggles, Larry ^a   Rambo, Patrick ^a   Porter, John ^a  

^a SANDIA NATIONAL LABORATORIES   (United States)

Author keywords

Laser damage threshold; Micro channel plate

Indexed keywords

AMPLIFICATION; DIFFRACTION GRATINGS; IN SITU PROCESSING; LASER BEAM EFFECTS; LASER OPTICS; LIGHT ABSORPTION; LIGHT AMPLIFIERS; NEODYMIUM LASERS; OPTICAL COATINGS; OPTICAL PARAMETRIC OSCILLATORS; ULTRAVIOLET RADIATION; VACUUM APPLICATIONS; YTTRIUM COMPOUNDS;

LASER DAMAGE THRESHOLD; MICRO CHANNEL PLATE; MICRO CHANNEL PLATE (MCP); XUV;

LASER DAMAGE;

EID: 18744386424     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.585377     Document Type: Conference Paper

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