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Volumn , Issue , 2004, Pages 157-174

Nonlinear large-signal scattering parameters: Theory and applications

Author keywords

[No Author keywords available]

Indexed keywords

DIAGNOSE FAILURES; FREQUENCY-DOMAIN MAPPING; NONLINEAR LARGE-SIGNAL SCATTERING PARAMETERS; NONLINEAR VECTOR NETWORK ANALYZERS;

EID: 18744363998     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper
Times cited : (21)

References (14)
  • 1
    • 0024089126 scopus 로고
    • High-frequency periodic time-domain waveform measurement system
    • M. Sipila, K. Lehtinen, and V. Porra, High-frequency periodic time-domain waveform measurement system, IEEE Trans Microwave Theory Tech 36 (1988), 1397-1405.
    • (1988) IEEE Trans Microwave Theory Tech , vol.36 , pp. 1397-1405
    • Sipila, M.1    Lehtinen, K.2    Porra, V.3
  • 2
    • 0024754871 scopus 로고
    • Measurement of magnitude and phase of harmonics generated in nonlinear microwave two-ports
    • U. Lott, Measurement of magnitude and phase of harmonics generated in nonlinear microwave two-ports, IEEE Trans Microwave Theory Tech 37 (1989), 1506-1511.
    • (1989) IEEE Trans Microwave Theory Tech , vol.37 , pp. 1506-1511
    • Lott, U.1
  • 3
    • 0025416450 scopus 로고
    • Error-corrected large-signal waveform measurement system combining network analyzer and sampling oscilloscope capabilities
    • G. Kompa and F. Van Raay, Error-corrected large-signal waveform measurement system combining network analyzer and sampling oscilloscope capabilities, IEEE Trans Microwave Theory Tech 38 (1990), 358-365.
    • (1990) IEEE Trans Microwave Theory Tech , vol.38 , pp. 358-365
    • Kompa, G.1    Van Raay, F.2
  • 4
    • 0029210706 scopus 로고
    • Accurate on wafer measurement of phase and amplitude of the spectral components of incident and scattered voltage waves at the signal ports of a nonlinear microwave device
    • May
    • J. Verspecht, P. Debie, A. Barel, and L. Martens, Accurate on wafer measurement of phase and amplitude of the spectral components of incident and scattered voltage waves at the signal ports of a nonlinear microwave device, 1995 IEEE MTT-S Int Microwave Symp Dig, May 1995, 1029-1032.
    • (1995) 1995 IEEE MTT-S Int Microwave Symp Dig , pp. 1029-1032
    • Verspecht, J.1    Debie, P.2    Barel, A.3    Martens, L.4
  • 7
    • 0043089051 scopus 로고    scopus 로고
    • Accurately characterizing hard nonlinear behavior of microwave components with the nonlinear network measurement system: Introducing 'nonlinear scattering functions'
    • Duisburg, Germany, Oct.
    • J. Verspecht and P. Van Esch, Accurately characterizing hard nonlinear behavior of microwave components with the nonlinear network measurement system: introducing 'nonlinear scattering functions,' Proceedings of the 5th International Workshop on Integrated Nonlinear Microwave and Millimeterwave Circuits, Duisburg, Germany, Oct. 1998, 17-26.
    • (1998) Proceedings of the 5th International Workshop on Integrated Nonlinear Microwave and Millimeterwave Circuits , pp. 17-26
    • Verspecht, J.1    Van Esch, P.2
  • 12
    • 12344255480 scopus 로고    scopus 로고
    • Developing frequency-domain models for nonlinear circuits based on large-signal measurements
    • Maastricht, the Netherlands, Aug., CD-ROM
    • J. A. Jargon, K. C. Gupta, D. Schreurs, and D. C. DeGroot, Developing frequency-domain models for nonlinear circuits based on large-signal measurements, URSI XXVIIth General Assembly, Maastricht, the Netherlands, Aug. 2002, CD-ROM.
    • (2002) URSI XXVIIth General Assembly
    • Jargon, J.A.1    Gupta, K.C.2    Schreurs, D.3    DeGroot, D.C.4
  • 14
    • 0007482480 scopus 로고    scopus 로고
    • Department of Electronics, Carleton University, Ottawa, Canada
    • Q. J. Zhang and his neural network research team, NeuroModeler, ver. 1.2, Department of Electronics, Carleton University, Ottawa, Canada, 1999.
    • (1999) NeuroModeler, Ver. 1.2
    • Zhang, Q.J.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.