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Volumn 4453, Issue , 2001, Pages 52-60

Integrated thermo-optic switches in silica/polymer waveguide technology

Author keywords

Hybrid integration; Integrated optics; Optical waveguide switch

Indexed keywords

COMPUTER SIMULATION; CROSSTALK; FINITE ELEMENT METHOD; INSERTION LOSSES; MULTILAYERS; OPTICAL DESIGN; OPTICAL WAVEGUIDES; POLARIZATION; POLYMERS; REFRACTIVE INDEX; SILICA;

EID: 18644385200     PISSN: 0277786X     EISSN: None     Source Type: Journal    
DOI: 10.1117/12.447634     Document Type: Article
Times cited : (2)

References (6)
  • 1
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    • Silica-based planar lightwave circuits: Passive and thermally active devices
    • T. Miya: "Silica-based planar lightwave circuits: Passive and thermally active devices", IEEE J. Select. Topics Quantum Electron., 6, pp. 38-45, 2000
    • (2000) IEEE J. Select. Topics Quantum Electron. , vol.6 , pp. 38-45
    • Miya, T.1
  • 2
    • 0032680413 scopus 로고    scopus 로고
    • Low crosstalk and low loss polymeric 1×8 digital optical switch
    • N. Ooba, S. Toyoda, and T. Kurihara: "Low crosstalk and low loss polymeric 1×8 digital optical switch", Electron. Lett., 35, pp. 1364-1365, 1999
    • (1999) Electron. Lett. , vol.35 , pp. 1364-1365
    • Ooba, N.1    Toyoda, S.2    Kurihara, T.3
  • 4
    • 0027685348 scopus 로고
    • Propagation loss characteristics of long silica-based optical waveguide on 5 inch Si wafers
    • Y. Hibino, H. Okazaki, Y. Hida, and Y. Ohmori: "Propagation loss characteristics of long silica-based optical waveguide on 5inch Si wafers", Electron. Lett., 29, pp. 1847-1848, 1993
    • (1993) Electron. Lett. , vol.29 , pp. 1847-1848
    • Hibino, Y.1    Okazaki, H.2    Hida, Y.3    Ohmori, Y.4
  • 5
    • 0030105662 scopus 로고    scopus 로고
    • Polymer waveguide optical switch with <-40dB polarisation independent crosstalk
    • N. Keil, H. H. Yao, C. Zawadzki: "Polymer waveguide optical switch with <-40dB polarisation independent crosstalk", Electron. Lett., 32, pp. 655-657, 1996
    • (1996) Electron. Lett. , vol.32 , pp. 655-657
    • Keil, N.1    Yao, H.H.2    Zawadzki, C.3
  • 6
    • 0023312194 scopus 로고
    • Thermal analysis of electromigration test structures
    • H. A. Schafft: "Thermal analysis of electromigration test structures", IEEE Trans. Electron. Devices, ED-34, pp. 664-672, 1987
    • (1987) IEEE Trans. Electron. Devices , vol.ED-34 , pp. 664-672
    • Schafft, H.A.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.