SCOPUS 정보 검색 플랫폼

Volumn 61, Issue 3, 2005, Pages

Eu1.8La0.2BaZnO5: A Rietveld refinement using X-ray powder diffraction

Author keywords

[No Author keywords available]

Indexed keywords

CERAMIC MATERIALS; CHARACTERIZATION; CRYSTAL STRUCTURE; CRYSTALLOGRAPHY; LANTHANUM; POSITIVE IONS; PRISMS; X RAY POWDER DIFFRACTION; ZINC OXIDE;

COORDINATION POLYHEDRA; IONIC RADII; SOLID-STATE REACTION; SQUARE-BASED PYRAMIDAL;

EUROPIUM COMPOUNDS;

EID: 18644374092 PISSN: 16005368 EISSN: None Source Type: Journal
DOI: 10.1107/S1600536805002886 Document Type: Article

Times cited : (2)

References (14)

1
- 0003173617
- Burdett, J. K. & Mitchell, J. F. (1990). J. Am. Chem. Soc. 112, 6571-6579.
- (1990) J. Am. Chem. Soc. , vol.112 , pp. 6571-6579
- Burdett, J.K.¹ Mitchell, J.F.²

2
- 0026368044
- Boultif, A. & Louër, D. (1991). J. Appl. Cryst. 24, 987-993.
- (1991) J. Appl. Cryst. , vol.24 , pp. 987-993
- Boultif, A.¹ Louër, D.²

3
- 0003626740
- Shape Software, 521 Hidden Valley Road, Kingsport, TN 37663, USA
- Dowty, E. (2000). A TOMS far Windows. Version 5.1. Shape Software, 521 Hidden Valley Road, Kingsport, TN 37663, USA.
- (2000) A TOMS Far Windows. Version 5.1
- Dowty, E.¹

4
- 0007200816
- Kaduk, J. A., Wong-Ng, W., Greenwood, W., Dillingham, J. & Toby, B. H. (1999). J. Res. Natl Inst. Stand. Technol. 104, 147-171.
- (1999) J. Res. Natl Inst. Stand. Technol. , vol.104 , pp. 147-171
- Kaduk, J.A.¹ Wong-Ng, W.² Greenwood, W.³ Dillingham, J.⁴ Toby, B.H.⁵

5
- 18644365007
- Lavat, A., Baran, E. J., Saez-Puche, R., Salinas-Sanchez, A. & Matin-Liorente, M. J. (1992). Vibr. Spectrosc. 3, 290-298.
- (1992) Vibr. Spectrosc. 3 , pp. 290-298
- Lavat, A.¹ Baran, E.J.² Saez-Puche, R.³ Salinas-Sanchez, A.⁴ Matin-Liorente, M.J.⁵

6
- 0020810586
- Michel, C. & Raveau, B. (1983). J. Solid State Chem. 49, 150-156.
- (1983) J. Solid State Chem. , vol.49 , pp. 150-156
- Michel, C.¹ Raveau, B.²

7
- 84987223875
- Mueller-Buschbaum H. & Rabbow, C. (1993). Z. Anorg. Allg. Chem. 619, 529-533.
- (1993) Z. Anorg. Allg. Chem. , vol.619 , pp. 529-533
- Mueller-Buschbaum, H.¹ Rabbow, C.²

8
- 0001993081
- Toulouse, France
- Rodríguez-Carvajal, J. (1990). FULLPROF. Abstracts of the Satellite Meeting on Powder Diffraction of the XV. Congress of the IUCr. p. 127, Toulouse, France.
- (1990) FULLPROF. Abstracts of the Satellite Meeting on Powder Diffraction of the XV. Congress of the IUCr , pp. 127
- Rodríguez-Carvajal, J.¹

9
- 0343410494
- Saez-Puche, R. & Hernandez-Velazeo, J. (1994). Adv. Mater. Res. 1-2, 65-82.
- (1994) Adv. Mater. Res. , vol.1-2 , pp. 65-82
- Saez-Puche, R.¹ Hernandez-Velazeo, J.²

10
- 84944648082
- Shannon, R. D. (1976). Acta Cryst. A32, 751-767.
- (1976) Acta Cryst. , vol.A32 , pp. 751-767
- Shannon, R.D.¹

11
- 49849126779
- Siegel, S., Hockstra, H. R. & Tani, B. S. (1969). J. Inorg. Nucl. Chem. 31, 3803-3807.
- (1969) J. Inorg. Nucl. Chem. , vol.31 , pp. 3803-3807
- Siegel, S.¹ Hockstra, H.R.² Tani, B.S.³

12
- 0004264015
- Siemens Analytical X-ray Instruments Inc., Madison, Wisconsin, USA
- Siemens (1993). DIFFRAC/AT. Version 3.2. Siemens Analytical X-ray Instruments Inc., Madison, Wisconsin, USA.
- (1993) DIFFRAC/AT. Version 3.2

13
- 84948109557
- Thompson, P., Cox, D. E. & Hastings, J. B. (1987). J. Appl. Cryst. 20, 79-83.
- (1987) J. Appl. Cryst. , vol.20 , pp. 79-83
- Thompson, P.¹ Cox, D.E.² Hastings, J.B.³

14
- 0032364873
- Wong-Ng, W., Toby, B. & Greenwood, W. (1998). Powder Diffract. 13, 144-151.
- (1998) Powder Diffract. , vol.13 , pp. 144-151
- Wong-Ng, W.¹ Toby, B.² Greenwood, W.³

* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.