Thickness dependence of irreversibility field in Bi-2212 thin films

Physica C: Superconductivity and its Applications

Volumn 378-381, Issue PART 1, 2002, Pages 570-574

  Wada, H ^a   Otabe, E S ^a   Matsushita, T ^a   Yasuda, T ^a   Uchiyama, T ^b   Iguchi, I ^b   Wang, Z ^c  

^a KYUSHU INSTITUTE OF TECHNOLOGY   (Japan)

^b TOKYO INSTITUTE OF TECHNOLOGY   (Japan)

^c NATIONAL INSTITUTE OF INFORMATION AND COMMUNICATIONS TECHNOLOGY   (Japan)

Author keywords

Bi 2212 thin film; Flux creep flow model; Irreversibility field

Indexed keywords

BISMUTH; CRITICAL CURRENT DENSITY (SUPERCONDUCTIVITY); MAGNETIC FLUX; MATHEMATICAL MODELS; SINGLE CRYSTALS; SUPERCONDUCTING MATERIALS;

IRREVERSIBILITY FIELDS;

MAGNETIC THIN FILMS;

EID: 18544395825     PISSN: 09214534     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0921-4534(02)01498-3     Document Type: Conference Paper

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