Structural and magnetic characterization of Fe/δ-Mn thin films

Physica B: Condensed Matter

Volumn 276-278, Issue , 2000, Pages 586-587

  Kentzinger, E ^a   Rucker U ^a   Caliebe, W ^a   Goerigk, G ^a   Werges, F ^a   Nerger, S ^a   Voigt, J ^a   Schmidt, W ^a   Alefeld, B ^a   Fermon, C ^b   Brückel, Th ^a  

^a FORSCHUNGSZENTRUM JÜLICH   (Germany)

^b SERVICE DE PHYSIQUE DE L ETAT CONDENSÉ   (France)

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTAL STRUCTURE; EPITAXIAL GROWTH; INTERFACES (MATERIALS); IRON; MANGANESE; MULTILAYERS; NEUTRON DIFFRACTION; REFLECTOMETERS; SURFACE ROUGHNESS; SYNCHROTRON RADIATION;

NONCOLLINEAR STRUCTURES; POLARIZED NEUTRON REFLECTOMETRY;

MAGNETIC THIN FILMS;

EID: 18544395728     PISSN: 09214526     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0921-4526(99)01408-8     Document Type: Article

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