Direct current scanning field emission microscope integrated with existing scanning electron microscope

Review of Scientific Instruments

Volumn 73, Issue 9, 2002, Pages 3215-

  Wang, Tong ^a   Reece, Charles E ^a   Sundelin, Ronald M ^a  

^a THOMAS JEFFERSON NATIONAL ACCELERATOR FACILITY   (United States)

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Indexed keywords

EID: 18544389678     PISSN: 00346748     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1499212     Document Type: Article

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