Evaluation of Russian grown Cd0.8Zn0.2Te

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 3115, Issue , 1997, Pages 305-310

  Schieber, M ^a   Hermon, H ^a   James, R B ^a   Lund, J ^a   Antolak, A ^a   Morse, D ^a   Kolesnikov, N N ^a   Ivanov, Yu N ^a   Goorsky, M S ^a   Yoon, H ^a   Toney, J ^a   Schlesinger, T E ^a  

^a SANDIA NATIONAL LABORATORIES   (United States)

Author keywords

CdZnTe; High Pressure Bridgman

Indexed keywords

CRYSTAL GROWTH; GAMMA RAYS; LEAKAGE CURRENTS; MICROSCOPIC EXAMINATION; PHOTOLUMINESCENCE; PROTONS; RADIATION DETECTORS; SINGLE CRYSTALS; X RAY DIFFRACTION ANALYSIS; X RAYS;

X RAY EMISSION;

CADMIUM COMPOUNDS;

EID: 18544378541     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.277699     Document Type: Conference Paper

References (10)

1. Growth and characterization of p-type Cdl-xZnxTe (x=.2,.3,.4)
2. Spatial characterization of cadmium zinc telluride radiation detector crystals