Sapphire statistical characterization and risk reduction program

Proceedings of SPIE-The International Society for Optical Engineering

Volumn 4375, Issue , 2001, Pages 20-30

  McClure, Donald R ^a   Cayse, Robert ^b   Black, David ^c   Goodrich, Stephen ^d   Lagerlöf, Peter ^e   Harris, Daniel C ^f   McCullum, Dale ^d,g   Platus, Daniel H ^h   Polvani, Robert ^c  

^a Army Space/Missile Defense Command   (United States)

^b Sy Technology Inc   (United States)

^c NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY   (United States)

^d UNIVERSITY OF DAYTON RESEARCH INSTITUTE   (United States)

^e CASE WESTERN RESERVE UNIVERSITY   (United States)

^f NAVAL AIR WARFARE CENTER   (United States)

^g AEROSPACE CORPORATION   (United States)

^h Teledyne Solutions Inc   (United States)

Author keywords

Mechanical strength; Nondestructive evaluation; Sapphire

Indexed keywords

CRYSTAL ORIENTATION; DATABASE SYSTEMS; MISSILES; NONDESTRUCTIVE EXAMINATION; RISK MANAGEMENT; SAPPHIRE; STRENGTH OF MATERIALS; THERMAL EFFECTS; X RAY ANALYSIS;

LASER THERMAL SHOCK TESTS; X-RAY TOPOGRAPHY;

STATISTICAL OPTICS;

EID: 18544377810     PISSN: 0277786X     EISSN: None     Source Type: Journal    
DOI: 10.1117/12.439184     Document Type: Article

References (20)

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