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Volumn 78, Issue 2-4, 2005, Pages 303-309
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Structural studies on ion-implanted semiconductors using X-ray synchrotron radiation: Strain evolution and growth of nanocrystals
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Author keywords
Compound semiconductors; Diamond; HRXRD; Ion bombardment; RBS
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Indexed keywords
AMORPHIZATION;
COMPUTER SIMULATION;
CRYSTAL GROWTH;
DIAMONDS;
HETEROJUNCTIONS;
ION BEAMS;
ION BOMBARDMENT;
ION IMPLANTATION;
MONTE CARLO METHODS;
SINGLE CRYSTALS;
SYNCHROTRON RADIATION;
TENSILE STRESS;
X RAY DIFFRACTION ANALYSIS;
X RAYS;
COMPOUND SEMICONDUCTORS;
GRAZING INCIDENCE;
ION BEAM SYNTHESIS (IBS);
LATTICE DISTORTIONS;
SEMICONDUCTOR MATERIALS;
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EID: 18544370566
PISSN: 0042207X
EISSN: None
Source Type: Journal
DOI: 10.1016/j.vacuum.2005.01.043 Document Type: Conference Paper |
Times cited : (3)
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References (15)
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