Semiconductor sensors application for definition of factor of ozone heterogeneous destruction on teflon surface

Sensors

Volumn 3, Issue 11, 2003, Pages 504-508

  Obvintseva, Ludmila A ^a   Chibirova, Fatima Kh ^a   Kazakov, Serge A ^a   Avetisov, Alexander K ^a   Strobkova, Marina V ^a   Finogenova, Nataliya V ^a  

^a KARPOV INSTITUTE OF PHYSICAL CHEMISTRY   (Russian Federation)

Author keywords

Heterogeneous death rate of ozone; Semiconductor sensors; Teflon

Indexed keywords

DECOMPOSITION; EXTRAPOLATION; MATHEMATICAL MODELS; OZONE; POLYTETRAFLUOROETHYLENES; SENSORS;

AIR STANDARD FOR OZONE (AAS); ELECTROCONDUCTIVITY; HETEROGENEOUS DEATH-RATE OF OZONE; SEMICONDUCTOR SENSORS;

SEMICONDUCTOR DEVICES;

EID: 18444411683     PISSN: 14243210     EISSN: None     Source Type: Journal    
DOI: 10.3390/s3110504     Document Type: Article

References (4)

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3. Obvintseva, L.A.; Gutman, E.E.; Gubanova, D.P. Semiconductor method application for investigation of photochemical reactions with chlorine and its oxygen compounds. Optics of atmosphere and ocean. 1998, Vol. 11, 1.
4. Skoblikova, A.L. Investigation of ozone heterogeneous decomposition and its evaluation in the atmosphere. Author's abstract for Ph.D. thesis (physics& mathematics). 1989, Leningrad.