High temperature infrared absorption of CVD diamond measured by laser calorimetry

Diamond and Related Materials

Volumn 14, Issue 3-7, 2005, Pages 580-583

  Worner E ^a   Wild, C ^a   Muller Sebert W ^a   Grimm, M ^a   Koidl, P ^a  

^a FRAUNHOFER INSTITUTE FOR APPLIED SOLID STATE PHYSICS IAF   (Germany)

Author keywords

Defects; High temperature calorimetric absorption measurements; Optical properties

Indexed keywords

CALORIMETRY; CHEMICAL VAPOR DEPOSITION; CRYSTAL STRUCTURE; DEFECTS; INFRARED RADIATION; LASERS; LIGHT ABSORPTION; OPTICAL PROPERTIES; THERMAL CONDUCTIVITY; TRANSPARENCY;

HIGH TEMPERATURE CALORIMETRIC ABSORPTION MEASUREMENTS; INFRARED ABSORPTION; LASER CALORIMETRY; STRUCTURAL QUALITIES;

DIAMOND FILMS;

EID: 18444404937     PISSN: 09259635     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.diamond.2004.12.027     Document Type: Conference Paper

References (11)

1. C. Wild B. Dischler C. Wild CVD diamond for optical windows, low pressure synthetic diamond: manufacturing and application 1998 Springer Heidelberg, Germany 189
2. E. Wörner B. Dischler C. Wild Thermal properties and applications of CVD diamond, low pressure synthetic diamond: manufacturing and application 1998 Springer Heidelberg, Germany 165
3. C.J.H. Wort, C.S.J. Pickels, A.C. Beale, C.G. Sweeney, M.R. McClymont, R.J. Saunders, R.S. Sussmann, and K.L. Lewis SPIE 3705 1999 276
4. E. Wörner, C. Wild, W. Müller-Sebert, and P. Koidl Diamond Relat. Mater. 10 2001 557
5. T.P. Mollart, C.J.H. Wort, C.S.J. Pickles, M.R. McClymont, N. Perkins, and K.L. Lewis SPIE 4375 2001 180
6. E. Wörner, C. Wild, W. Müller-Sebert, R. Locher, and P. Koidl Proc. 9th CIMTEC-World Forum on New Materials, Symp. IV, Firenze, Italy 1999 305
7. D.C. Harris SPIE 2286 1994 218
8. M. Füner, C. Wild, and P. Koidl Appl. Phys. Lett. 72 1998 1149
9. T.P. Mollart, K.L. Lewis, C.S.J. Pickles, and C.J.H. Wort Semicond. Sci. Technol. 18 2003 117
10. J. Wagner, C. Wild, and P. Koidl Appl. Phys. Lett. 59 1991 779
11. E. Wörner, J. Wagner, W. Müller-Sebert, C. Wild, and P. Koidl Appl. Phys. Lett. 68 1996 1482