External second gate, Fourier Transform ion mobility spectrometry: Parametric optimization for detection of weapons of mass destruction

Sensors

Volumn 4, Issue 1-3, 2004, Pages

  Tarver, Edward E ^a  

^a SANDIA NATIONAL LABORATORIES   (United States)

Author keywords

Explosive samples; External second gate; Fourier Transform ion mobility spectrometry; Ion mobility spectrometry

Indexed keywords

CARRIER MOBILITY; DIFFUSION; ELECTRIC FIELD EFFECTS; ELECTRODES; EXPLOSIVES; FOURIER TRANSFORMS; FREQUENCY DOMAIN ANALYSIS; MATRIX ALGEBRA; OPTIMIZATION; SENSITIVITY ANALYSIS; SIGNAL TO NOISE RATIO; SPECTROMETRY;

CHEMICAL WEAPONS CONVENTION (CWC); EXPLOSIVE SAMPLES; EXTERNAL SECOND GATE; FOURIER TRANSFORM ION MOBILITY SPECTROMETRY (FT-IMS); ION MOBILITY SPECTROMETRY (IMS); PARAMETRIC OPTIMIZATION; WEAPONS OF MASS DESTRUCTIONS;

SPECTROSCOPIC ANALYSIS;

EID: 18444390290     PISSN: 14243210     EISSN: None     Source Type: Journal    
DOI: 10.3390/s40100001     Document Type: Article

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