Digital speckle techniques for measuring light deflection profiles of inhomogeneous phase objects

Applied Optics

Volumn 36, Issue 28, 1997, Pages 7180-7187

  Lapsien, Joachim ^a   Meiners, Dieter ^a  

^a HEINRICH HEINE UNIVERSITY   (Germany)

Author keywords

Ccd camera; Cross correlation technique; Digital speckle pattern cinematography; Digital speckle pattern photography; Light deflection in inhomogeneous phase objects

Indexed keywords

EID: 18444381209     PISSN: 1559128X     EISSN: 21553165     Source Type: Journal    
DOI: 10.1364/AO.36.007180     Document Type: Article

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