Summary of ISO/TC 201 standard: XVIII, ISO 19318:2004 - Surface chemical analysis - X-ray photoelectron spectroscopy - Reporting of methods used for charge control and charge correction

Surface and Interface Analysis

Volumn 37, Issue 5, 2005, Pages 524-526

  Baer, D R ^a  

^a PACIFIC NORTHWEST NATIONAL LABORATORY   (United States)

Author keywords

Charge compensation; Charge referencing; International Organization for Standardization; ISO; Specimen charging; X ray photoelectron spectroscopy; XPS

Indexed keywords

BINDING ENERGY; COMPOSITION; DATA REDUCTION; ELECTRIC CHARGE; INSULATING MATERIALS; STANDARDIZATION; X RAY PHOTOELECTRON SPECTROSCOPY;

CHARGE COMPENSATION; CHARGE REFERENCE; INTERNATIONAL ORGANIZATION FOR STANDARDIZATION (ISO); SPECIMEN CHARGING;

SURFACE CHEMISTRY;

EID: 18444375546     PISSN: 01422421     EISSN: None     Source Type: Journal    
DOI: 10.1002/sia.2034     Document Type: Article

References (4)

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3. Bart F, Guitter MJ, Henriot M, Thromat N, Gautier M, Durand JP. J. Electron Spectrosc. Relat. Phenom. 1994; 69: 245.
4. Unger WES, Gross T, Bose O, Lippitz A, Fritz T, Gelius U. Surf. Interface Anal. 2000; 29: 535.