3-(2-Chlorophenyl)-4-phenyl-1,2,4-triazole-5-thione

Acta Crystallographica Section C: Crystal Structure Communications

Volumn 55, Issue 4, 1999, Pages 581-582

  Kumaran, D ^a   Ponnuswamy, M N ^a   Jayanthi, G ^a   Ramakrishnan, V T ^a   Chinnakali, K ^b,c   Fun, H K ^b  

^a UNIVERSITY OF MADRAS   (India)

^b SCHOOL OF PHYSICS   (Malaysia)

^c ANNA UNIVERSITY   (India)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 18444371936     PISSN: 01082701     EISSN: None     Source Type: Journal    
DOI: 10.1107/S0108270198013808     Document Type: Article

References (17)

1. Allen, F. H., Kennard, O., Watson, D. G., Brammer, L., Orpen, A. G. & Taylor, R. (1987). J. Chem. Soc. Perkin Trans. 2, pp. S1-19.
2. Bennur, S. C., Jigajinni, V. B. & Badiger, V. C. (1976). Chem. Abstr. 85, 94306j.
3. Gorter, S. & Engelfriet, D. W. (1981). Acta Cryst. B37, 1214-1218.
4. Groeneveld, L. R., Vos, G., Gorter, S. & Haasnoot, J. G. (1982). Acta Cryst. B38, 2248-2250.
5. Heubach, G., Sachse, B. & Buerstell, H. (1980). Chem. Abstr. 92, 181200h.
6. Jayanthi, G., Muthuswamy, S., Paramasivam, R., Ramakrishnan, V. T., Ramasamy, N. K. & Ramamurthy. P. (1997). J. Org. Chem. 62, 5766-5770.
7. Kokkou, S. C. & Rentzeperis, P. J. (1975). Acta Cryst. B31, 1564-1570.
8. Mohamed, E. A., El-Deen, I. M., Ismail, M. M. & Mohamed, S. M. (1993). Indian J. Chem. 32B, 933-937.
9. Nardelli, M. (1983). Acta Cryst. C39, 1141-1142.
10. Nardelli, M. (1995). J. Appl. Cryst. 28, 659.
11. Sharma, R. S. & Bahel, S. C. (1982). J. Indian Chem. Soc. 59, 877-880.
12. Sheldrick, G. M. (1985). SHELXS86. Program for the Solution of Crystal Structures. University of Göttingen, Germany.
13. Sheldrick, G. M. (1996). SADABS. Program for Empirical Absorption Correction of Area-Detector Data. University of Göttingen, Germany.
14. Sheldrick.,G. M. (1997). SHELXL97. Program for the Refinement of Crystal Structures. University of Göttingen, Germany.
15. Siemens (1996a). SMART Software Reference Manual. Siemens Analytical X-ray Instruments Inc., Madison, Wisconsin, USA.
16. Siemens (1996b). SAINT Software Reference Manual. Version 4. Siemens Analytical X-ray Instruments Inc., Madison, Wisconsin, USA.
17. Zsolnai, L. (1997). ZORTEP. Interactive Graphics Program. University of Heidelberg, Germany.