Singular Grain Boundaries in Alumina Doped with Silica

Journal of the American Ceramic Society

Volumn 87, Issue 3, 2004, Pages 507-509

  Kim, Mi Jin ^a   Kim, Seung Min ^a   Yoon, Duk Yong ^a,b  

^a Korea Advanced Institute of Science and Technology (KAIST)   (South Korea)

^b AMERICAN CERAMIC SOCIETY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CAPILLARITY; DIFFRACTION; DOPING (ADDITIVES); EUTECTICS; GRAIN BOUNDARIES; MATERIALS SCIENCE; MICROSTRUCTURE; SAPPHIRE; SCANNING ELECTRON MICROSCOPY; SILICA; SINGLE CRYSTALS; SINTERING; TORQUE; TRANSMISSION ELECTRON MICROSCOPY;

CAPILLARITY VECTORS; DIFFRACTION PATTERNS;

ALUMINA;

EID: 1842833449     PISSN: 00027820     EISSN: None     Source Type: Journal    
DOI: 10.1111/j.1551-2916.2004.00507.x     Document Type: Article

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