Structural phase transition of the two-dimensional fluoride ion conductor KSn2F5 studied by X-ray diffraction

Solid State Ionics

Volumn 167, Issue 3-4, 2004, Pages 301-307

  Yamada, Koji ^a   Ahmad, Mohamad M ^a   Ohki, Hiroshi ^a   Okuda, Tsutomu ^a   Ehrenberg, Helmut ^b   Fuess, Hartmut ^b  

^a HIROSHIMA UNIVERSITY   (Japan)

^b DARMSTADT UNIVERSITY OF TECHNOLOGY   (Germany)

Author keywords

Fluoride ion conductor; MEM analysis; Phase transition; Rietveld analysis; X ray diffraction

Indexed keywords

ACTIVATION ENERGY; ELECTRIC IMPEDANCE; FLUORINE; IONIC CONDUCTION; LATTICE CONSTANTS; NUCLEAR MAGNETIC RESONANCE SPECTROSCOPY; PHASE TRANSITIONS; SINGLE CRYSTALS; X RAY DIFFRACTION ANALYSIS;

FLUORIDE ION CONDUCTORS; RIETVELD ANALYSIS;

POTASSIUM COMPOUNDS;

EID: 1842831058     PISSN: 01672738     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.ssi.2003.09.004     Document Type: Article

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