Crystal structure refinement of CuxAg1-xInTe 2 bulk material determined from X-ray powder diffraction data using the Rietveld method

Crystal Research and Technology

Volumn 39, Issue 3, 2004, Pages 266-273

  Moustafa, A M ^a   El Sayad, E A ^a   Sakr, G B ^b  

^a NATIONAL RESEARCH CENTRE   (Egypt)

^b Ain Shams University   (Egypt)

Author keywords

AgInTe2: Cu replacement; Chalcopyrite; Crystal structure; Rietveld refinement method; X ray powder diffraction

Indexed keywords

CRYSTAL STRUCTURE; ENERGY DISPERSIVE SPECTROSCOPY; INGOTS; LATTICE CONSTANTS; LIGHT EMITTING DIODES; POLYCRYSTALLINE MATERIALS; SEMICONDUCTOR MATERIALS; SOLAR CELLS; STOICHIOMETRY; X RAY POWDER DIFFRACTION;

AGINTE2; CHALCOPYRITE; CU-REPLACEMENT; RIETVELD REFINEMENT METHOD;

COPPER ALLOYS;

EID: 1842811176     PISSN: 02321300     EISSN: None     Source Type: Journal    
DOI: 10.1002/crat.200310181     Document Type: Article

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