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Volumn 5168, Issue , 2004, Pages 508-517

HRTEM analysis of Pt/c multilayers

Author keywords

Dc magnetron sputtering; High resolution transmission electron microscopy; Interface structure; Ion beam sputtering; Nano scale fabrication; Pt C multilayer mirror; Thin film; X ray optics

Indexed keywords

CARBON; ELECTRON DIFFRACTION; FABRICATION; HIGH RESOLUTION ELECTRON MICROSCOPY; ION BEAMS; MAGNETRON SPUTTERING; PLATINUM; SILICON WAFERS; SUBSTRATES; THIN FILMS; X RAY OPTICS;

EID: 1842789993     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.508632     Document Type: Conference Paper
Times cited : (6)

References (10)
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    • Evans, B.L.1    Kent, B.J.2
  • 6
    • 0006286992 scopus 로고
    • Nucleation and growth of platinum and nickel films on amorphous carbon substrates
    • B. L. Evans, A. I. Maaroof and S. Xu, "Nucleation and growth of platinum and nickel films on amorphous carbon substrates", J. Appl. Phys., 76, 900-907, 1994.
    • (1994) J. Appl. Phys. , vol.76 , pp. 900-907
    • Evans, B.L.1    Maaroof, A.I.2    Xu, S.3
  • 7
    • 0037098430 scopus 로고    scopus 로고
    • Interface roughness correlation due to changing layer period in Pt/C multilayers
    • A. Paul and G. S. Lodha, "Interface roughness correlation due to changing layer period in Pt/C multilayers", Phys. Rev. B, 65, 245416, 2002.
    • (2002) Phys. Rev. B , vol.65 , pp. 245416
    • Paul, A.1    Lodha, G.S.2
  • 8
    • 0034905816 scopus 로고    scopus 로고
    • X-ray standing wave and reflectometric characterization of multilayer structures
    • S. K. Ghose and B. N. Dev, "X-ray standing wave and reflectometric characterization of multilayer structures", Phys. Rev. B, 63, 245409, 2001.
    • (2001) Phys. Rev. B , vol.63 , pp. 245409
    • Ghose, S.K.1    Dev, B.N.2
  • 9
    • 0035939396 scopus 로고    scopus 로고
    • Ion-irradiation-induced mixing, interface broadening and period dilation in Pt/C multilayers
    • S. K. Ghose, D. K. Goswami, B. Rout, B. N. Dev, G. Kuri and G. Materlik, "Ion-irradiation-induced mixing, interface broadening and period dilation in Pt/C multilayers", Appl. Phys. Let., 79, 467-469, 2001.
    • (2001) Appl. Phys. Let. , vol.79 , pp. 467-469
    • Ghose, S.K.1    Goswami, D.K.2    Rout, B.3    Dev, B.N.4    Kuri, G.5    Materlik, G.6
  • 10
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    • Transmission electron microscopy study on microstructure of tungsten/carbon multilayer films
    • T. Oshino, D. Shindo, M. Hirabayashi, E. Aoyagi and H. Nikaido, "Transmission electron microscopy study on microstructure of tungsten/carbon multilayer films", Jpn. J. Appl. Phys., 28, 1909-1904, 1989.
    • (1989) Jpn. J. Appl. Phys. , vol.28 , pp. 1909-1904
    • Oshino, T.1    Shindo, D.2    Hirabayashi, M.3    Aoyagi, E.4    Nikaido, H.5


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.