High frequency conductance of a quantum point contact

Physica E: Low-Dimensional Systems and Nanostructures

Volumn 22, Issue 1-3, 2004, Pages 272-275

  Regul, J ^a   Hohls, F ^a   Reuter, D ^b   Wieck, A D ^b   Haug, R J ^a  

^a LEIBNIZ UNIVERSITY HANNOVER   (Germany)

^b RUHR UNIVERSITY BOCHUM   (Germany)

Author keywords

AFM lithography; High frequency conductance; Quantum point contact

Indexed keywords

ATOMIC FORCE MICROSCOPY; CAPACITANCE; COAXIAL CABLES; ELECTRIC CONDUCTANCE; ELECTRIC POTENTIAL; ELECTRON TRANSITIONS; HETEROJUNCTIONS; POINT CONTACTS;

ATOMIC FORCE MICROSCOPE (AFM) LITHOGRAPHY; HIGH FREQUENCY CONDUCTANCE; QUANTUM POINT CONTACT (QPC);

QUANTUM THEORY;

EID: 1842785392     PISSN: 13869477     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.physe.2003.11.266     Document Type: Conference Paper

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