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Volumn 53, Issue 2, 2004, Pages 155-156
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Advances, Issues, and Research in Testing Practices Around the World
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Author keywords
[No Author keywords available]
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Indexed keywords
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EID: 1842783946
PISSN: 0269994X
EISSN: None
Source Type: Journal
DOI: 10.1111/j.1464-0597.2004.00165.x Document Type: Review |
Times cited : (7)
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References (0)
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