Random Walk Deposition with Relaxation

Journal of the Korean Physical Society

Volumn 44, Issue 3 I, 2004, Pages 543-546

  Song, Hyun Suk ^a   Kim, Jin Min ^a  

^a Soongsil University   (South Korea)

Author keywords

Critical exponent; Local slope; Normalized surface width; Random walk deposition; Surface width

Indexed keywords

EID: 1842767180     PISSN: 03744884     EISSN: None     Source Type: Journal    
DOI: 10.3938/jkps.44.543     Document Type: Conference Paper

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