Process modeling procedure for verification, validation and testing planning

Proceedings of the ASME Design Engineering Technical Conference

Volumn 3, Issue , 2003, Pages 875-884

  Lévárdy, Viktor ^a   Hoppe, Markus ^a   Wenzel, Stefan ^b   Vollerthun, Andreas ^b  

^a TECHNICAL UNIVERSITY OF MUNICH   (Germany)

^b 3D Systems Engineering GmbH   (Germany)

Author keywords

Programmatic risk reduction; Risk management; Technical performance measurement; Test planning; Test process modeling; Validation; Verification

Indexed keywords

COST EFFECTIVENESS; DECISION MAKING; LIFE CYCLE; OPTIMIZATION; RISK MANAGEMENT; STRATEGIC PLANNING; SYSTEMS ENGINEERING;

PROGRAMMATIC RISK REDUCTION; TECHNICAL PERFORMANCE MEASUREMENT; TEST PLANNING; TEST PROCESS MODELING; VALIDATION; VERIFICATION;

PRODUCT DEVELOPMENT;

EID: 1842737131     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (21)

1. Browning, T.R., 1998, "Use of Dependency Structure Matrices for Product Development Cycle Time Reduction", Proceedings of the Fifth ISPE International Conference on Concurrent Engineering: Research and Applications, Tokyo, Japan
2. Browning, T.R., 1998, "Modeling and Analyzing Cost, Schedule, and Performance in Complex System Product Development", PhD Thesis, Massachusetts Institute of Technology, December, http://lean.mit.edu/
3. Browning, T.R.; Deyst, J.J. Jr.; Eppinger S.D.; Whitney D.E., 2002, "Adding Value in Product Development by Creating Information and Reducing Risk", IEEE Transactions on Engineering Management, 49(4): 443-458., http://home.earthlink.net/~tvson.browning/pubs/Theses.htm
4. Browning, T.R.; Eppinger S.D., 2002, "Modeling Impacts of Process Architecture on Cost and Schedule Risk in Product Development", IEEE Transactions on Engineering Management, 49(4): 428-442 http://home.earttlink. net/~tyson.browtijng/pubs/Theses.htm
5. Department of Defense (DoD), 2001, "Systems Engineering Fundamentals", The Defense Acquisition University Press, Fort Belvoir, VA, January
6. Department of Defense (DoD), 2001, "Test and Evaluation Management Guide", The Defense Acquisition University Press, Fort Belvoir, VA, November
7. Department of Defense (DoD), 2002, "Risk Management Guide for DoD Acquisition", The Defence Acquisition University Press, Fort Belvoir, VA
8. Ehrlenspiel, K., 1995, "Integrierte Produktentwicklung", Carl Hanser Verlag, München
9. Engel, A., Barad, M., 2003, "A Methodology for Modeling VVT Risks and Costs", Systems Engineering, Volume 6, issue 3, Wiley InterScience, Online ISSN: 1520-6858, Print ISSN: 1098-1241
10. Eppinger, S.D., Smith, R.P., 1997, "A Predictive Model of Sequential Iteration in Engineering Design", Management Science, vol. 43, no. 8, pp. 1104-1120
11. th Annual International Symposium of INCOSE
12. INCOSE, 1995, "Metrics Guidebook for Integrated Systems and Product Development" International Council on Systems Engineering
13. Juran, J.M., 1988, "Juran's Quality Control Handbook", McGraw-Hill
14. Pisano, N.D. CDR, 1995, "Technical Performance Measurement, Earned Value, and Risk Management: An Integrated Diagnostic Tool for Program Management", http://www.acq.osd.mil/pm/tpm/nickpaso.htm
15. Pol, M, Koomen, T, Spillner, A, 2000, "Management und Optimierung des Testprozesses: Ein praktischer Leitfaden für erfolgreiches Testen von Software mit TPI und TMap" Heidelberg, dpunkt-Verlag
16. Swift, J.A., Ross, R.E., Omachonu, V.K., 1998, "Principles of Total Quality", St. Lucie Press, Boca Raton, FL
17. Taguchi, G, Wu, J., 1980, "Introduction to Off-Line Quality Control", Central Japan Quality Association, Nagoya, Japan
18. Thomke, S., Loch, C. H., Terwiesch, C., 2001, "Parallel and Sequential Testing of Design Alternatives", Management Science Vol. 45, No. 5, pp. 663-678
19. Thomke, S., Bell, D.E., 2001, "Sequential Testing in Product Development", Management Science, Vol. 47, No. 2, February, pp. 308-323
20. Vollerthun, A, Engel, A, Haskins C, 2002, "Methodology Development for Systems Verification, Validation & Testing", INCOSE 2002 Twelfth Annual International Symposium, Las Vegas
21. VVT Glossary, 2003, SysTest internal document