Variationally consistent multi-scale modeling and homogenization of stressed grain growth

Computer Methods in Applied Mechanics and Engineering

Volumn 193, Issue 17-20, 2004, Pages 1825-1848

  Chen, Jiun Shyan ^a   Mehraeen, Shafigh ^a  

^a UNIVERSITY OF CALIFORNIA   (United States)

Author keywords

Asymptotic expansion; Grain boundary migration; Grain growth; Homogenization; Multi scale

Indexed keywords

COMPUTER SIMULATION; ELECTRONIC COMMUNITIES; GRAIN BOUNDARIES; MATHEMATICAL INSTRUMENTS; MECHANICAL ALLOYING; MICROSTRUCTURE; POLYCRYSTALLINE MATERIALS; STRESS ANALYSIS; THERMODYNAMICS;

ELECTROMAGNETIC PROPERTIES; HOMOGENIZATION; MULTI-SCALE MODELING;

GRAIN GROWTH;

GRAIN BOUNDARY; HOMOGENIZATION;

EID: 1842736761     PISSN: 00457825     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.cma.2003.12.038     Document Type: Article

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