-
1
-
-
0346737182
-
Flexible computer integrated manufacturing systems
-
Taipei, Taiwan, R.O.C.
-
K. Nguyen, "Flexible computer integrated manufacturing systems," in Proc. SEMICON Taiwan 96 IC Seminar, Taipei, Taiwan, R.O.C., 1996, pp. 241-247.
-
(1996)
Proc. SEMICON Taiwan 96 IC Seminar
, pp. 241-247
-
-
Nguyen, K.1
-
2
-
-
0003379502
-
Comparative advantage through manufacturing execution systems
-
Taipei, Taiwan, R.O.C.
-
D. Scott, "Comparative advantage through manufacturing execution systems," in Proc. SEMICON Taiwan 96 IC Seminar, Taipei, Taiwan, R.O.C., 1996, pp. 227-236.
-
(1996)
Proc. SEMICON Taiwan 96 IC Seminar
, pp. 227-236
-
-
Scott, D.1
-
4
-
-
0000009254
-
Development of a system framework for the computer-integrated manufacturing execution system: A distributed object-oriented approach
-
Sept./Oct.
-
F.-T. Cheng, E. Shen, J.-Y. Deng, and K. Nguyen, "Development of a system framework for the computer-integrated manufacturing execution system: A distributed object-oriented approach," Int. J. Comput. Integr. Manuf., vol. 12, pp. 384-402, Sept./Oct. 1999.
-
(1999)
Int. J. Comput. Integr. Manuf.
, vol.12
, pp. 384-402
-
-
Cheng, F.-T.1
Shen, E.2
Deng, J.-Y.3
Nguyen, K.4
-
5
-
-
0028427872
-
The MMST computer-integrated manufacturing system framework
-
Feb.
-
J. McGehee, J. Hebley, and J. Mahaffey, "The MMST computer-integrated manufacturing system framework," IEEE Trans. Semiconduct, Manufact., vol. 7, pp. 107-115, Feb. 1994.
-
(1994)
IEEE Trans. Semiconduct, Manufact.
, vol.7
, pp. 107-115
-
-
McGehee, J.1
Hebley, J.2
Mahaffey, J.3
-
7
-
-
0011896094
-
-
Semiconductor Equipment and Materials International
-
SEMI, Equipment Automation/Software vol. 1 and 2, Semiconductor Equipment and Materials International, 1996.
-
(1996)
Equipment Automation/Software
, vol.1-2
-
-
-
9
-
-
84945713135
-
Applying design by contract
-
Oct.
-
B. Meyer, "Applying design by contract," IEEE Comput., vol. 25, pp. 40-51, Oct. 1992.
-
(1992)
IEEE Comput.
, vol.25
, pp. 40-51
-
-
Meyer, B.1
-
16
-
-
84862344158
-
-
[Online]
-
Veritas (2000). Veritas FirstWatch [Online]. Available: http://www.veritas.com/us/products/firstwatch.
-
(2000)
Veritas FirstWatch
-
-
-
17
-
-
0027796299
-
Software implemented fault tolerance: Technologies and experience
-
Toulouse, France
-
Y. Huang and C. Kintala, "Software implemented fault tolerance: Technologies and experience," in Proc. 23rd Int. Symp. Fault-tolerance Computing (FTCS), Toulouse, France, 1993, pp. 2-10.
-
(1993)
Proc. 23rd Int. Symp. Fault-tolerance Computing (FTCS)
, pp. 2-10
-
-
Huang, Y.1
Kintala, C.2
-
18
-
-
0034198039
-
FADI: A fault tolerant environment for open distributed computing
-
June
-
T. Osman and A. Bargiela, "FADI: A fault tolerant environment for open distributed computing," in Proc. IEE Software, vol. 147, no. 3, pp. 91-99, June 2000.
-
(2000)
Proc. IEE Software
, vol.147
, Issue.3
, pp. 91-99
-
-
Osman, T.1
Bargiela, A.2
-
19
-
-
1842641667
-
-
Fault Tolerant CORBA Specification, Dec.
-
Object Management Group, Fault Tolerant CORBA Specification, OMG Document orbos/99-12-08 edition, Dec. 1999.
-
(1999)
OMG Document Orbos/99-12-08 Edition
-
-
-
21
-
-
80051925280
-
DOORS: Towards high-performance fault tolerant CORBA
-
B. Natarajan, A. Gokhale, and S. Yajnik, "DOORS: Towards high-performance fault tolerant CORBA," in Proc. IEEE Int. Symp. Distributed Objects and Applications, 2000, pp. 39-48.
-
(2000)
Proc. IEEE Int. Symp. Distributed Objects and Applications
, pp. 39-48
-
-
Natarajan, B.1
Gokhale, A.2
Yajnik, S.3
-
22
-
-
0031624640
-
T spaces
-
Aug.
-
P. Wyckoff, S. Mclaughry, T. Lehman, and D. Ford, "T spaces," IBM Syst. J., vol. 37, pp. 454-474, Aug. 1998.
-
(1998)
IBM Syst. J.
, vol.37
, pp. 454-474
-
-
Wyckoff, P.1
McLaughry, S.2
Lehman, T.3
Ford, D.4
-
23
-
-
0003683068
-
-
Reading. MA: Addison-Wesley
-
K. Arnold. B. O'Sullivan, R.W. Scheifler, J. Waldo, and A. Wollrath, The jini Specification. Reading. MA: Addison-Wesley, 1999.
-
(1999)
The Jini Specification
-
-
Arnold, K.1
O'Sullivan, B.2
Scheifler, R.W.3
Waldo, J.4
Wollrath, A.5
-
25
-
-
0004198444
-
-
Englewood Cliffs, NY: Prentice-Hall
-
B. Meyer, Eiffel: The Language. Englewood Cliffs, NY: Prentice-Hall, 1992.
-
(1992)
Eiffel: The Language
-
-
Meyer, B.1
-
26
-
-
0003846817
-
-
Englewood Cliffs, NJ: The Sun Microsystems Press
-
W. K. Edwards, Core JINI. Englewood Cliffs, NJ: The Sun Microsystems Press, 1999.
-
(1999)
Core JINI
-
-
Edwards, W.K.1
-
28
-
-
0033285503
-
Development of a generic equipment manager for semiconductor manufacturing
-
Barcelona, Spain, Oct.
-
H.-C. Yang, F.-T. Cheng, and D. Huang, "Development of a generic equipment manager for semiconductor manufacturing," in Proc. 7th IEEE Int. Conf. Emeiging and Factory Automation (ETFA '99), Barcelona, Spain, Oct. 1999, pp. 727-732.
-
(1999)
Proc. 7th IEEE Int. Conf. Emeiging and Factory Automation (ETFA '99)
, pp. 727-732
-
-
Yang, H.-C.1
Cheng, F.-T.2
Huang, D.3
-
29
-
-
0035508794
-
Enhancement of semiconductor equipment communications using a web-enabled equipment driver
-
Nov.
-
F-T. Cheng and M.-T. Lin, "Enhancement of semiconductor equipment communications using a web-enabled equipment driver," IEEE Trans. Semiconduct. Manufact., vol. 14, pp. 372-380, Nov. 2001.
-
(2001)
IEEE Trans. Semiconduct. Manufact.
, vol.14
, pp. 372-380
-
-
Cheng, F.-T.1
Lin, M.-T.2
-
31
-
-
0034294032
-
Modeling and analysis of equipment managers in manufacturing execution systems for semiconductor packaging
-
Oct.
-
F.-T. Cheng, H.-C. Yang, T.-L Kuo, C. Feng, and M. Jeng, "Modeling and analysis of equipment managers in manufacturing execution systems for semiconductor packaging," IEEE Trans. Syst. Man Cybern., vol. 30, pp. 772-782, Oct. 2000.
-
(2000)
IEEE Trans. Syst. Man Cybern.
, vol.30
, pp. 772-782
-
-
Cheng, F.-T.1
Yang, H.-C.2
Kuo, T.-L.3
Feng, C.4
Jeng, M.5
-
35
-
-
0019004535
-
Signature analysis for mechanical systems via dynamic data system (DDS) monitoring technique
-
Apr.
-
S. Wu, T. Tobin, and M. Chow, "Signature analysis for mechanical systems via dynamic data system (DDS) monitoring technique," J. Mech. Design, pp. 217-221, Apr. 1980.
-
(1980)
J. Mech. Design
, pp. 217-221
-
-
Wu, S.1
Tobin, T.2
Chow, M.3
-
36
-
-
1842742427
-
Use statistical analysis to predict equipment reliability
-
Oct.
-
A. McElroy and I. Fruchtman, "Use statistical analysis to predict equipment reliability," Power, p. 39, Oct. 1991.
-
(1991)
Power
, pp. 39
-
-
McElroy, A.1
Fruchtman, I.2
-
37
-
-
0003084462
-
An EWMA for monitoring a process standard deviation
-
S. Crowder and M. Hamilton, "An EWMA for monitoring a process standard deviation," J. Qual. Technol., vol. 24, no. 1, pp. 12-21, 1992.
-
(1992)
J. Qual. Technol.
, vol.24
, Issue.1
, pp. 12-21
-
-
Crowder, S.1
Hamilton, M.2
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