Development of a metric to quantify beam quality of reflectorized lamps

Journal of the Illuminating Engineering Society

Volumn 32, Issue 1, 2003, Pages 63-72

  Simonson, Kevin ^a   Narendran, Nadarajah ^a   Boyce, Peter ^a   Bierman, Andrew ^a  

^a RENSSELAER POLYTECHNIC INSTITUTE   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 1842706064     PISSN: 00994480     EISSN: None     Source Type: Journal    
DOI: 10.1080/00994480.2003.10748405     Document Type: Article

References (23)

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