Measurement of thin film thickness by electronic speckle pattern interferometry

Optics Communications

Volumn 234, Issue 1-6, 2004, Pages 269-276

  Karaaliog̃lu, Canan ^a   Skarlatos, Yani ^a  

^a BOGAZICI UNIVERSITY   (Turkey)

Author keywords

[No Author keywords available]

Indexed keywords

CAMERAS; CHARGE COUPLED DEVICES; ELECTRIC FIELD EFFECTS; FAST FOURIER TRANSFORMS; IMAGE PROCESSING; INTERFEROMETERS; INTERFEROMETRY; LIGHT INTERFERENCE; PHASE SHIFT; SPECKLE; VECTORS;

ELECTRONIC SPECKLE PATTERN INTERFEROMETRY (ESPI); MICHELSON INTERFEROMETERS;

THIN FILMS;

EID: 1842615022     PISSN: 00304018     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.optcom.2004.02.025     Document Type: Article

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