A re-examination of scanning tunneling spectroscopy for its practical application in studies of surface electronic structures

Surface Science

Volumn 554, Issue 2-3, 2004, Pages 253-261

  Li, Nan ^a   Zinke Allmang, Martin ^a   Iwasaki, Hiroshi ^b  

^a UNIVERSITY OF WESTERN ONTARIO   (Canada)

^b OSAKA UNIVERSITY   (Japan)

Author keywords

Computer simulations; Scanning tunneling spectroscopies; Surface electronic phenomena (work function, surface potential, surface states, etc.); Tunneling

Indexed keywords

AUGER ELECTRON SPECTROSCOPY; COMPUTER SIMULATION; ELECTRON TUNNELING; ELECTRONIC EQUIPMENT; EPITAXIAL GROWTH; FUNCTIONS; MATHEMATICAL MODELS; PHOTOELECTRON SPECTROSCOPY; PROBABILITY;

SURFACE ELECTRONIC PHENOMENA; ULTRA VIOLET PHOTOELECTRON SPECTROSCOPY (AES);

SCANNING TUNNELING MICROSCOPY;

EID: 1842610450     PISSN: 00396028     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.susc.2004.01.062     Document Type: Article

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