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Volumn 69, Issue 8, 2004, Pages
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Fermi contour imaging of the two-dimensional semimetal ErSi2 by Fourier transform STM
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Author keywords
[No Author keywords available]
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Indexed keywords
ERBIUM;
METAL;
SILICON;
ARTICLE;
ELECTRON;
FOURIER TRANSFORMATION;
ION TRANSPORT;
LOW TEMPERATURE PROCEDURES;
SCANNING TUNNELING MICROSCOPY;
WAVEFORM;
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EID: 1842584648
PISSN: 10980121
EISSN: 1550235X
Source Type: Journal
DOI: 10.1103/PhysRevB.69.081305 Document Type: Article |
Times cited : (17)
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References (13)
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