Crystal growth and investigation of CuAlxGa1-xTe 2 solid solutions

Journal of Crystal Growth

Volumn 265, Issue 1-2, 2004, Pages 214-219

  Bodnar, I V ^a   Victorov, I A ^a   Dabranski, V M ^a  

^a BELARUSIAN STATE UNIVERSITY OF INFORMATICS AND RADIOELECTRONICS   (Belarus)

Author keywords

A1. Differential thermal analysis; A1. Microhardness; A1. Phase diagram; A1. Thermal conductivity; A1. Thermal expansion coefficients; A1. X ray diffraction; B1. Chalcopyrite; B2. Semiconducting ternary compounds

Indexed keywords

ANNEALING; COMPOSITION; COPPER ALLOYS; DENSITY (SPECIFIC GRAVITY); DIFFERENTIAL THERMAL ANALYSIS; MICROHARDNESS; SEMICONDUCTOR MATERIALS; SOLID SOLUTIONS; TERNARY SYSTEMS; THERMAL CONDUCTIVITY OF SOLIDS; THERMAL EXPANSION; X RAY DIFFRACTION ANALYSIS;

CHALCOPYRITES; SEMICONDUCTING TERNARY COMPOUNDS;

CRYSTAL GROWTH;

EID: 1842579913     PISSN: 00220248     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jcrysgro.2004.01.058     Document Type: Article

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