Isotope effects in the electronic spectrum of S+ and Se+ in silicon

Physical Review B - Condensed Matter and Materials Physics

Volumn 69, Issue 8, 2004, Pages

  Pajot, B ^a   Clerjaud, B ^a   Mc Cluskey, M D ^b  

^a CNRS   (France)

^b WASHINGTON STATE UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CHALCOGEN; ISOTOPE; SELENIUM; SILICON; SULFUR;

ARTICLE; ATOM; CHEMICAL BINDING; ELECTRON; ENERGY; FOURIER TRANSFORM MASS SPECTROMETRY; IONIZATION; VIBRATION;

EID: 1842564049     PISSN: 10980121     EISSN: 1550235X     Source Type: Journal    
DOI: 10.1103/PhysRevB.69.085210     Document Type: Article

References (23)

1. G. Davies, E. C. Lightowlers, and M. do Carmo, J. Phys. C 16, 5503 (1983).
2. K. Pressel, K. Thonke, A. Dörnen, and G. Pensl, Phys. Rev. B 43, 2239 (1991).
3. A. Hoffmann and U. Scherz, J. Cryst. Growth 101, 385 (1990).
4. W. Kohn and J. M. Luttinger, Phys. Rev. 98, 915 (1955).
5. H. G. Grimmeiss, E. Janzén, and K. Larsson, Phys. Rev. B 25, 2627 (1982).
6. J. B. Wright and A. Mooradian, Phys. Rev. Lett. 67, 608 (1967).
7. K. Jain and M. V. Klein, Phys. Rev. B 13, 5448 (1976).
8. W. E. Krag, in Proceedings of the 10th International Conference on Physics and Semiconductors, edited by S. P. Keller, J. C. Hensel, and F. Stern (US Atomic Energy Commission, Oak Ridge, Tennessee, 1970), p. 271.
9. H. G. Grimmeiss and E. Janzén, in Handbook on Semiconductors, edited by T. S. Moss, in Materials, Properties and Preparation, edited by S. Mahajan (North-Holland, Amsterdam, 1994), Vol. 3b, p. 1755.
10. G. W. Ludwig, Phys. Rev. 137, A1520 (1965).
11. E. E. Haller, B. Joós, and L. M. Falicov, Phys. Rev. B 21, 4729 (1980).
12. B. Clerjaud, D. Côte, A. Lebkiri, C. Naud, J. M. Baranowski, K. Pakula, D. Wasik, and T. Suski, Phys. Rev. B 61, 8238 (2000).
13. W. E. Krag, W. H. Kleiner, and H. J. Zeiger, Phys. Rev. B 33, 8304 (1986).
14. E. Janzén, R. Stedman, G. Grossmann, and H. G. Grimmeiss, Phys. Rev. B 29, 1907 (1984).
15. P. Wagner, in Properties of Crystalline Silicon, edited by R. Hull, EMIS Datareviews Series No. 20 (INSPEC, London, 1999), p. 573.
16. K. Bergman, G. Grossmann, H. G. Grimmeiss, Michael Stavola, and Robert E. McMurray, Jr., Phys. Rev. B 39, 1104 (1989).
17. B. Pajot, E. Artacho, C. A. J. Ammerlaan, and J. M. Spaeth, J. Phys.: Condens. Matter 7, 7077 (1995).
18. M. D. Sciacca, A. K. J. Mayur, H. Kim, I. Miotkowski, A. K. Ramdas, and S. Rodriguez, Phys. Rev. B 53, 12878 (1996).
19. V. Heine and C. H. Henry, Phys. Rev. B 11, 3795 (1975).
20. J. E. Rosenthal, Phys. Rev. 45, 538 (1934).
21. J. F. Angress, A. R. Goodwin, and S. D. Smith, Proc. R. Soc. London, Ser. A 308, 111 (1968).
22. M. Caner and R. Englman, J. Chem. Phys. 44, 4054 (1966).
23. R. A. Forman, Appl. Phys. Lett. 37, 776 (1980).