Modeling Drop Shape on Contaminated Surfaces or Surfaces with Physical Structures

Langmuir

Volumn 20, Issue 6, 2004, Pages 2277-2281

  Mohanty, Sanat ^a   Ylitalo, Caroline ^a   Woo, Oh Sang ^a  

^a 3M COMPANY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

SILICONE LINERS; SURFACE CONTAMINANTS;

CONTAMINATION; IMAGE QUALITY; POROUS MATERIALS; PRINTING; SILICONES; SURFACE ROUGHNESS; SURFACE STRUCTURE; SWELLING; WETTING;

SURFACE CHEMISTRY;

CHEMISTRY; IMAGE QUALITY; POLLUTION; POLYSILICONES; POROUS MATERIALS; SURFACE STRUCTURE; SWELLING;

EID: 1842530156     PISSN: 07437463     EISSN: None     Source Type: Journal    
DOI: 10.1021/la035008b     Document Type: Article

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