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Volumn 227, Issue 1-4, 2004, Pages 410-415
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Thermal diffusivity measurements of semiconducting amorphous Ge x Se 100-x thin films by photothermal deflection technique
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Author keywords
Amorphous chalcogenides; PBD technique; Thermal diffusivity
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Indexed keywords
ELECTRIC RESISTANCE;
GERMANIUM COMPOUNDS;
GLASS;
MATHEMATICAL MODELS;
MODULATION;
PROBES;
SEMICONDUCTOR MATERIALS;
THERMAL DIFFUSION;
VACUUM;
AMORPHOUS CHALCOGENIDES;
PBD TECHNIQUES;
PROBE BEAM DEFLECTION;
THIN FILMS;
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EID: 1842529009
PISSN: 01694332
EISSN: None
Source Type: Journal
DOI: 10.1016/j.apsusc.2003.12.020 Document Type: Article |
Times cited : (15)
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References (20)
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