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Volumn 227, Issue 1-4, 2004, Pages 410-415

Thermal diffusivity measurements of semiconducting amorphous Ge x Se 100-x thin films by photothermal deflection technique

Author keywords

Amorphous chalcogenides; PBD technique; Thermal diffusivity

Indexed keywords

ELECTRIC RESISTANCE; GERMANIUM COMPOUNDS; GLASS; MATHEMATICAL MODELS; MODULATION; PROBES; SEMICONDUCTOR MATERIALS; THERMAL DIFFUSION; VACUUM;

EID: 1842529009     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.apsusc.2003.12.020     Document Type: Article
Times cited : (15)

References (20)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.