Frequency dependent characterization of transport properties in carbon nanotube transistors

Applied Physics Letters

Volumn 84, Issue 10, 2004, Pages 1771-1773

  Appenzeller, J ^a   Frank, D J ^a  

^a IBM T J WATSON RESEARCH CENTER   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ATTENUATION; ELECTRIC POTENTIAL; FIELD EFFECT TRANSISTORS; FREQUENCIES; FREQUENCY RESPONSE; LEAKAGE CURRENTS; SIGNAL PROCESSING; SILICON; TRANSPORT PROPERTIES;

SIGNAL DEGRADATION; TRANSISTOR TRANSFER CHARACTERISTICS;

CARBON NANOTUBES;

EID: 1842528906     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1655696     Document Type: Article

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