Hot small-signal S-parameter measurements of power transistors operating under large-signal conditions in a load-pull environment for the study of nonlinear parametric interactions

IEEE Transactions on Microwave Theory and Techniques

Volumn 52, Issue 3, 2004, Pages 805-812

  Gasseling, Tony ^a   Barataud, Denis ^a   Mons, Sébastien ^a,b   Nebus, Jean Michel ^a   Villotte, Jean Pierre ^a   Obregon, Juan J ^a   Quere, Raymond ^a  

^a UNIVERSITY OF LIMOGES   (France)

^b CNRS   (France)

Author keywords

Hot small signal S parameters; Load pull measurement; Parametric instability; Small signal large signal interaction

Indexed keywords

BANDWIDTH; ELECTRIC IMPEDANCE; PERTURBATION TECHNIQUES; SCATTERING PARAMETERS; SIGNAL NOISE MEASUREMENT;

HOT SMALL SIGNAL; NONLINEAR PARAMETRIC INTERACTIONS; PARAMETRIC INSTABILITY; POWER TRANSISTOR;

TRANSISTORS;

EID: 1842527453     PISSN: 00189480     EISSN: None     Source Type: Journal    
DOI: 10.1109/TMTT.2004.823528     Document Type: Article

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