Measurement of dynamic deformation using a superimposed grating

Revista Mexicana de Fisica

Volumn 50, Issue 1, 2004, Pages 12-18

  Barrientos, B ^a   Cywiak, M ^a   Lee, W K ^b   Bryanston Cross, P ^b  

^a CENTRO DE INVESTIGACIONES EN ÓPTICA   (Mexico)

^b UNIVERSITY OF WARWICK   (United Kingdom)

Author keywords

Double exposure method; Dynamic deformation; Fringe projection; Spatial carrier fringe method

Indexed keywords

EID: 1842527397     PISSN: 0035001X     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

References (14)

1. R. Windecker and H. J. Tiziani, "Topometry of technical and biological objects by fringe projection," App. Opt. 34 (1995) 3644.
2. G. Indebetouw, "Profile measurement using projection of running fringes," App. Opt. 17 (1978) 2930.
3. E. Srinivasan, H. C. Liu and M. Alioua, "Automated phase-measuring profilometry of 3D diffuse objects," App. Opt. 23 (1984) 3105.
4. M. Takeda and K. Mutoh, "Fourier transform profilometry for the automatic measurement of 3-D object shapes," App. Opt., 22 (1983) 3977.
5. H. O. Saldner and J. M. Huntley, "Temporal phase unwrapping: application to surface profiling of discontinuous objects," App. Opt. 36 (1997) 2770.
6. S. Tang and Y. Y. Hung, "Fast profilometer for the automatic measurement of 3-D object shapes," App. Opt. 29 (1990) 3012.
7. B. Dessus and M. Leblanc, "The 'fringe method' and its application to the measurement of deformation, vibrations, contour lines and differences of onjects," Opto-electronics 5 (1973) 369.
8. E. Archbold and A. E. Ennos, "Displacement measurement from double-exposure laser photographs," Opt. Acta 19 (1972) 253.
9. D.W. Robinson and D.C. Williams, "Digital phase stepping speckle interferometry," Opt. Comm. 57 (1985) 26.
10. A.J. Moore, J.R. Tyrer and F. Mendoza S, "Phase extraction from electronic speckle interferometry addition fringes," App. Opt. 33 (1994) 7312.
11. T. Kreis, "Holographic interferometry: Principles and Methods, " Akademie Verlag, Berlin 1996.
12. K. Creath and J.C. Wyant, "Comparison of interferometric contouring techniques," SPIE 954 (1988) 174.
13. S. Nakadate and H. Saito, "Fringe scanning speckle-pattern interferometry," App. Opt. 24 (1985) 2172.
14. A. J. Moore, D. P. Hand, J. S. Barton, and J. D. C. Jones, "Transient deformation measurement with electronic speckle pattern interferometry and a high-speed camera," App. Opt. 38 (1999) 1159.