Single Sided x-ray inspection of vehicles using AS&E's Z-Backscatter Van

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 5199, Issue , 2003, Pages 19-25

  Chalmers, Alex ^a  

^a American Science and Engineering Inc   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

X-RAY IMAGING; X-RAY INSPECTION SYSTEMS;

ALGORITHMS; ELECTROMAGNETIC WAVE BACKSCATTERING; GROUND VEHICLES; IMAGE PROCESSING; IMAGE QUALITY; INSPECTION; SCANNING; X RAY SCATTERING; X RAY TUBES;

IMAGING SYSTEMS;

EID: 1842523980     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (0)