Si-associated goethite in hydrothermal sediments of the Atlantis II and Thetis Deeps, Red Sea

Clays and Clay Minerals

Volumn 52, Issue 1, 2004, Pages 115-129

  Taitel Goldman, Nurit ^a,b   Koch, Christian Bender ^c   Singer, Arieh ^b  

^a OPEN UNIVERSITY OF ISRAEL   (Israel)

^b HEBREW UNIVERSITY OF JERUSALEM   (Israel)

^c UNIVERSITY OF COPENHAGEN   (Denmark)

Author keywords

Analytical electron microscopy; Atlantis II Deep; Crystal properties; High resolution transmission electron microscopy; Hydrothermal sediments; Infrared spectroscopy; M ssbauer spectroscopy; Si associated goethite; Thetis Deep; X ray diffraction

Indexed keywords

CRYSTALLIZATION; HYDROTHERMAL SYNTHESIS; INFRARED SPECTROSCOPY; SEDIMENTS; SODIUM; TRANSMISSION ELECTRON MICROSCOPY; X RAY DIFFRACTION;

GOETHITE; MULTI-DOMAIN CRYSTALLITES;

SILICON;

CRYSTALLINITY; GOETHITE; GROWTH RATE; HYDROTHERMAL DEPOSIT; MARINE SEDIMENT; SILICON;

ATLANTIS II DEEP; INDIAN OCEAN; RED SEA [INDIAN OCEAN]; THETIS DEEP;

EID: 1842505109     PISSN: 00098604     EISSN: None     Source Type: Journal    
DOI: 10.1346/CCMN.2004.0520111     Document Type: Article

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